Description - Electron and Ion Microscopy and Microanalysis: Principles and Applications, Second Edition, by Lawrence E Murr
The publication date of the first edition is not stated, but the new edition is apparently considerably revised and expanded. It was written to serve as a multi-purpose text at the senior or graduate level and as a reference for the practicing scientist or engineer. Readers should have a math backgr
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Metallurgical Applications of Shock-Wave and High-Strain Rate Phenomena
