Description - Guidebook for Managing Silicon Chip Reliability by Michael Pecht
This is an excellent text detailing situations the professional will encounter in practice. The book: - Includes an extensive table detailing the types of mechanism failures, such as self-heating and hot carrier aging. - Examines deep sub-micron challenges, such as power dissipation, switching noise, and cross talk - Outlines how to establish the specifications defining chip performance, cost, quality, and reliability. - Concentrates on device failure and causes throughout the text - showing how to model the mechanism, test for defects, and avoid and manage damange. - Presents information on evolving IC technologies.
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