BooksDirect

Description - Measuring the Electronic Structure of Atomically Uniform Silver Films Grown on Silicon Using Angle-Resolved Photoemission Spectroscopy by Nathan James Speer

Enjoy a wide range of dissertations and theses published from graduate schools and universities from around the world. Covering a wide range of academic topics, we are happy to increase overall global access to these works and make them available outside of traditional academic databases. These works are packaged and produced by BiblioLabs under license by ProQuest UMI. The description for these dissertations was produced by BiblioLabs and is in no way affiliated with, in connection with, or representative of the abstract meta-data associated with the dissertations published by ProQuest UMI. If you have any questions relating to this particular dissertation, you may contact BiblioLabs directly.

Buy Measuring the Electronic Structure of Atomically Uniform Silver Films Grown on Silicon Using Angle-Resolved Photoemission Spectroscopy by Nathan James Speer from Australia's Online Independent Bookstore, BooksDirect.

A Preview for this title is currently not available.